Gate leakage logic detection for analog CMOS circuit

• Main Authors: Kamisian, Izam, Ibrahim, Muhamad Faisal, A'ain, Abu Khari, Lee, Yuen Tat, Tan, Terrence Huat Hin
• Format: Book Section
• Language: English
• Published: Penerbit UTM 2008
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/31033/1/AbuKhariA%27ain2008_GateLeakageLogicDetectionforAnalog.pdf; http://eprints.utm.my/id/eprint/31033/

In micron technology node, Igate is not a big issue to circuit designer due to its negligible value. But in deep submicron technology node, Igate is one of the major and dominant leakage components. Igate is also reacts to process variation. As this issue arise, circuit designer need to aware the im...