Digital detection of gate leakage for analog CMOS circuit

• Main Authors: Ibrahim, Muhammad Faisal, Kamisian, Izam, A'ain, Abu Khari, Lee, Yuen Tat, Terrence, Tan Huat Hin
• Format: Conference or Workshop Item
• Published: 2007
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/13926/

RSM conference series has become the prominent international forum on semiconductor electronics embracing all aspects of the semiconductor technology from circuit device, modeling and simulation, photonics and sensor technology, MEMS technology, process and fabrication, packaging technology and manu...