Integration of smed and triz in improving productivity at semiconductor industry

• 主要作者: Kumaresan, Kartik Sreedharaan
• 格式: Thesis
• 語言: English
• 出版: 2011
• 主題: TS Manufactures
• 在線閱讀: http://eprints.utm.my/id/eprint/29896/6/KartikSreedharaanKumaresanMFKM2011.pdf; http://eprints.utm.my/id/eprint/29896/

A case study on a test handler’s changeover process was conducted in a semiconductor organization (Intel Technology Sdn. Bhd.). The test handler being a constraint operation in the production supports the testing of two of the mainstream chipset products. Though the test handler is capable to suppor...