Integration of smed and triz in improving productivity at semiconductor industry
A case study on a test handler’s changeover process was conducted in a semiconductor organization (Intel Technology Sdn. Bhd.). The test handler being a constraint operation in the production supports the testing of two of the mainstream chipset products. Though the test handler is capable to suppor...
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主要作者: | Kumaresan, Kartik Sreedharaan |
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格式: | Thesis |
语言: | English |
出版: |
2011
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主题: | |
在线阅读: | http://eprints.utm.my/id/eprint/29896/6/KartikSreedharaanKumaresanMFKM2011.pdf http://eprints.utm.my/id/eprint/29896/ |
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