Integration of smed and triz in improving productivity at semiconductor industry

A case study on a test handler’s changeover process was conducted in a semiconductor organization (Intel Technology Sdn. Bhd.). The test handler being a constraint operation in the production supports the testing of two of the mainstream chipset products. Though the test handler is capable to suppor...

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主要作者: Kumaresan, Kartik Sreedharaan
格式: Thesis
语言:English
出版: 2011
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在线阅读:http://eprints.utm.my/id/eprint/29896/6/KartikSreedharaanKumaresanMFKM2011.pdf
http://eprints.utm.my/id/eprint/29896/
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