Classification of the marking on integrated circuit chips based on moments and projection profile - a comparison

• Main Authors: Kartigayan, M., Nagarajan, R., Yaacob, Sazali, Pandian, Paulraj, Rizon, Mohammed, H. M. Amin, Shamsudin, Khalid, Marzuki
• Format: Conference or Workshop Item
• Language: English
• Published: 2005
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/1860/1/Sham05_Classification_of_the_Marking.pdf; http://eprints.utm.my/id/eprint/1860/

In this paper, an Industrial machine vision system incorporating Optical Character Recognition (OCR) is employed to inspect the marking on the Integrated Circuit (IC) Chips. This inspection is carried out while the ICs are coming out from the manufacturing line. A TSSOP-DGG type of IC package from T...