Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube

In scaling down to 10 nm, the electron transportation is predominantly ballistic. Moreover, in most of the doped nanoscale devices, the carrier density is in the degenerate regime. In these cases the failure of Boltzmann statistic has led the research to new explanations. In this paper the authors f...

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Main Authors: Ismail, Razali, Karamdel, Javad, Ahmadi, M. Taghi, Damghanian, Mitra, Majlis, Burhanuddin Yeop M., Dee, ChangFu
Format: Article
Published: Matrice Technology Ltd. 2009
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Online Access:http://eprints.utm.my/id/eprint/13055/
http://dx.doi.org/10.1179/143307509X440325
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spelling my.utm.130552011-07-15T01:40:49Z http://eprints.utm.my/id/eprint/13055/ Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube Ismail, Razali Karamdel, Javad Ahmadi, M. Taghi Damghanian, Mitra Majlis, Burhanuddin Yeop M. Dee, ChangFu TK Electrical engineering. Electronics Nuclear engineering In scaling down to 10 nm, the electron transportation is predominantly ballistic. Moreover, in most of the doped nanoscale devices, the carrier density is in the degenerate regime. In these cases the failure of Boltzmann statistic has led the research to new explanations. In this paper the authors formulate and simulate the carrier concentration in a semiconducting single wall carbon nanotube using the Fermi-Dirac distribution function. It was shown that the band structure of semiconducting single wall carbon nanotube nearby the minimum energy is parabolic and density of state is proportional to the Fermi-Dirac distribution. In the non-degenerate regime, Fermi energy is a weak logarithmic function of carrier concentration and varies linearly with temperature, but for strongly degenerate statistics, the Fermi energy is a strong function of carrier concentration and is independent of temperature. Matrice Technology Ltd. 2009-09 Article PeerReviewed Ismail, Razali and Karamdel, Javad and Ahmadi, M. Taghi and Damghanian, Mitra and Majlis, Burhanuddin Yeop M. and Dee, ChangFu (2009) Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube. Materials Research Innovations, 13 (3). pp. 211-213. ISSN 1432-8917 http://dx.doi.org/10.1179/143307509X440325 DOI: 10.1179/143307509X440325
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Ismail, Razali
Karamdel, Javad
Ahmadi, M. Taghi
Damghanian, Mitra
Majlis, Burhanuddin Yeop M.
Dee, ChangFu
Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube
description In scaling down to 10 nm, the electron transportation is predominantly ballistic. Moreover, in most of the doped nanoscale devices, the carrier density is in the degenerate regime. In these cases the failure of Boltzmann statistic has led the research to new explanations. In this paper the authors formulate and simulate the carrier concentration in a semiconducting single wall carbon nanotube using the Fermi-Dirac distribution function. It was shown that the band structure of semiconducting single wall carbon nanotube nearby the minimum energy is parabolic and density of state is proportional to the Fermi-Dirac distribution. In the non-degenerate regime, Fermi energy is a weak logarithmic function of carrier concentration and varies linearly with temperature, but for strongly degenerate statistics, the Fermi energy is a strong function of carrier concentration and is independent of temperature.
format Article
author Ismail, Razali
Karamdel, Javad
Ahmadi, M. Taghi
Damghanian, Mitra
Majlis, Burhanuddin Yeop M.
Dee, ChangFu
author_facet Ismail, Razali
Karamdel, Javad
Ahmadi, M. Taghi
Damghanian, Mitra
Majlis, Burhanuddin Yeop M.
Dee, ChangFu
author_sort Ismail, Razali
title Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube
title_short Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube
title_full Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube
title_fullStr Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube
title_full_unstemmed Analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube
title_sort analysis and simulation of carriers statistic for semiconducting single wall carbon nanotube
publisher Matrice Technology Ltd.
publishDate 2009
url http://eprints.utm.my/id/eprint/13055/
http://dx.doi.org/10.1179/143307509X440325
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score 13.2014675