Hybrid non scan with built-in self-test for fault coverage improvement

• المؤلفون الرئيسيون: Ahmadi, Azra, Paraman, Norlina, Rusli, Mohd. Shahrizal, Isaak, Suhaila
• التنسيق: Conference or Workshop Item
• منشور في: 2023
• الموضوعات: TK Electrical engineering. Electronics Nuclear engineering
• الوصول للمادة أونلاين: http://eprints.utm.my/108077/; http://dx.doi.org/10.1063/5.0120960

Conventional design for testability (DFT) method that implements scan designs requires long test application time and costly automatic test equipment (ATE). On the other hand, built-in self-test (BIST) methods reduce the test time, but with low fault coverage. In this paper, we propose a DFT method...