Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy
In this work, we have studied the structural and electrical behavior of Si-incorporated carbon nanostructures (Si-CNS) by performing current-voltage (I-V) measurements using in situ transmission electron microscopy (TEM). The I-V measurement and TEM observation of the corresponding Si-CNS structural...
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Main Authors: | , , , , , , , |
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Format: | Article |
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Elsevier Ltd
2022
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Online Access: | http://eprints.utm.my/103086/ http://dx.doi.org/10.1016/j.mtcomm.2022.104081 |
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