Study of structural and electrical behavior of silicon-carbon nanocomposites via in situ transmission electron microscopy

• Main Authors: Yaakob, Yazid, Lin, Wei Ming, Rosmi, Mohamad Saufi, Mohd. Yusop, Mohd. Zamri, Sharma, Subash, Chan, Kar Fei, Asaka, Toru, Tanemura, Masaki
• Format: Article
• Published: Elsevier Ltd 2022
• Subjects: Q Science (General)
• Online Access: http://eprints.utm.my/103086/; http://dx.doi.org/10.1016/j.mtcomm.2022.104081

In this work, we have studied the structural and electrical behavior of Si-incorporated carbon nanostructures (Si-CNS) by performing current-voltage (I-V) measurements using in situ transmission electron microscopy (TEM). The I-V measurement and TEM observation of the corresponding Si-CNS structural...