Copper wire bond improvement on aluminum interface for optimum high emperature storage reliability performance

• 第一著者: Wong, Jia Yi
• フォーマット: 学位論文
• 言語: English; English
• 出版事項: 2021
• 主題: T Technology (General); TS Manufactures
• オンライン･アクセス: http://eprints.utem.edu.my/id/eprint/26955/1/Copper%20wire%20bond%20improvement%20on%20aluminum%20interface%20for%20optimum%20high%20emperature%20storage%20reliability%20performance.pdf; http://eprints.utem.edu.my/id/eprint/26955/2/Copper%20wire%20bond%20improvement%20on%20aluminum%20interface%20for%20optimum%20high%20emperature%20storage%20reliability%20performance.pdf; http://eprints.utem.edu.my/id/eprint/26955/; https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=121720

Copper wire bonding has becoming popular as semiconductor packaging interconnect method due to its advantages over gold wire. Lower cost, better conductivity and lower resistivity are the main factors. Copper wires are harder than gold wire, therefore higher ultrasonic power and bond force require f...