Comparative High-K Material Gate Spacer Impact In DG-FinFET Parameter Variations Between Two Structures
This paper investigates the impact of the high-K material gate spacer on short channel effects (SCEs) for the 16 nm double-gate FinFET (DG-FinFET), where depletion-layer widths of the source-drain corresponds to the channel length. Virtual fabrication process along with design modification throughou...
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Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Institute of Advanced Engineering and Science
2019
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Online Access: | http://eprints.utem.edu.my/id/eprint/24221/2/AFROSLAN-IJEECS_MAY2019.PDF http://eprints.utem.edu.my/id/eprint/24221/ http://ijeecs.iaescore.com/index.php/IJEECS/article/view/16750/11918# |
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