Impact of intrinsic parameter fluctuation on the fault tolerance of L1 data cache

• Main Authors: Ahmed, Rabah Abood, Samsudin, Khairulmizam, Rokhani, Fakhrul Zaman
• Format: Conference or Workshop Item
• Language: English
• Published: IEEE 2009
• Online Access: http://psasir.upm.edu.my/id/eprint/69411/1/Impact%20of%20intrinsic%20parameter%20fluctuation%20on%20the%20fault%20tolerance%20of%20L1%20data%20cache.pdf; http://psasir.upm.edu.my/id/eprint/69411/

As the semiconductor process technology continues to scale deeper into the nanometer region, the intrinsic parameter fluctuations will aggressively affect the performance and reliability of future microprocessors and System-on-Chip (SoC) applications. These system requires large SRAM arrays that occ...