Testing static single cell faults using static and dynamic data background

• Main Authors: Zakaria, Nor Azura, Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Wen, Xiaoqing
• Format: Conference or Workshop Item
• Language: English
• Published: IEEE 2011
• Online Access: http://psasir.upm.edu.my/id/eprint/69132/1/Testing%20static%20single%20cell%20faults%20using%20static%20and%20dynamic%20data%20background.pdf; http://psasir.upm.edu.my/id/eprint/69132/

This work proposes a bit-adjacent Data Background (DB) management scheme to improve fault coverage of March algorithms while simultaneously maintaining the shortest test cycle. Both static and dynamic DB transitions are used in order to detect Deceptive Read Destructive Faults (DRDFs) and Write Dist...