Modeling and measuring dielectric constants for very thin materials using a coaxial probe
This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1-0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to...
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Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
Radioengineering Society
2014
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Online Access: | http://psasir.upm.edu.my/id/eprint/34543/1/Modeling%20and%20measuring%20dielectric%20constants%20for%20very%20thin%20materials%20using%20a%20coaxial%20probe.pdf http://psasir.upm.edu.my/id/eprint/34543/ |
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