Modeling and measuring dielectric constants for very thin materials using a coaxial probe

• Main Authors: You, Kok Yeow, Abbas, Zulkifly, Lee, Chia Yew, Abd Malek, Mohd Fareq, Lee, Kim Yee, Cheng, Ee Meng
• Format: Article
• Language: English
• Published: Radioengineering Society 2014
• Online Access: http://psasir.upm.edu.my/id/eprint/34543/1/Modeling%20and%20measuring%20dielectric%20constants%20for%20very%20thin%20materials%20using%20a%20coaxial%20probe.pdf; http://psasir.upm.edu.my/id/eprint/34543/

This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1-0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to the coaxial probe. The measured reflection coefficients for the thin samples were taken with a vector network analyzer up to 7 GHz, and the calibrated reflection coefficients were converted to relative dielectric constants using an empirical reflection coefficient model. The empirical model was created using the regression method and expressed as a polynomial model, and the coefficients of the model were obtained by fitting the data using the Finite Element Method (FEM).