Space-Charge-Limited Dark Injection (SCL DI) transient measurements

• Main Authors: Yap B.K., Koh S.P., Tiong S.K., Ong C.N.
• Other Authors: 26649255900
• Format: Conference paper
• Published: 2023
• Subjects: Semiconductor materials; Transient analysis; Bulk materials; Charge-carrier mobility; Dark injection; Injection efficiency; Mobility value; Nano scale; Space-charge-limited; Thin layers; Time-of-flight photocurrents; Transient measurement; Carrier mobility

It is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection...