In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS
Heterojunctions; Interfaces (materials); Light emitting diodes; Organic light emitting diodes (OLED); Photoelectrons; Photons; Charge-generation layers; Electron extraction; Energy differences; Energy level alignment; Poly(9-vinylcarbazole); Solution-processed; Tandem OLED; Vacuum level shift; X ray...
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2023
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my.uniten.dspace-231482023-05-29T14:38:00Z In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS Talik N.A. Yap B.K. Tan C.Y. Whitcher T.J. 55576358000 26649255900 16029485400 26641611700 Heterojunctions; Interfaces (materials); Light emitting diodes; Organic light emitting diodes (OLED); Photoelectrons; Photons; Charge-generation layers; Electron extraction; Energy differences; Energy level alignment; Poly(9-vinylcarbazole); Solution-processed; Tandem OLED; Vacuum level shift; X ray photoelectron spectroscopy We present in-depth analysis of an n/p heterojunction that consists of 1,4,5,8,9,11-hexaazatriphenylene hexacarbonitrile (HAT(CN)6) (n-type) and Poly(9-vinylcarbazole) (PVK) (p-type) via X-ray Photoelectron Spectroscopy (XPS) and Ultra-violet Photoelectron Spectroscopy (UPS) measurement. The p-type layer is doped with 2�wt% of 1,1-bis-(4-bis(4-tolyl)-aminophenyl) cyclohexene (TAPC). The energy difference (?E) at the hetero-junction, magnitude of band bending (Vb) and the vacuum level shift at the interface is modified when PVK is doped with 2�wt% TAPC. The presence of Vb at the HAT(CN)6/PVK (PVK:TAPC) interface makes it easier to reach a ?E ? 0 energy offset in order to facilitate charge generation at the interface. Via a Fowler-Nordheim (FN) tunneling curve, it is found that the electron extraction from PVK to HAT(CN)6�at the interface could occur via the tunneling process. This finding provides new insights into novel solutions for high efficiency tandem OLEDs. � 2017 Elsevier B.V. Final 2023-05-29T06:38:00Z 2023-05-29T06:38:00Z 2017 Article 10.1016/j.cap.2017.04.012 2-s2.0-85018723533 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85018723533&doi=10.1016%2fj.cap.2017.04.012&partnerID=40&md5=a938439101431e7696779b830cdce7bd https://irepository.uniten.edu.my/handle/123456789/23148 17 8 1094 1099 Elsevier B.V. Scopus |
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Heterojunctions; Interfaces (materials); Light emitting diodes; Organic light emitting diodes (OLED); Photoelectrons; Photons; Charge-generation layers; Electron extraction; Energy differences; Energy level alignment; Poly(9-vinylcarbazole); Solution-processed; Tandem OLED; Vacuum level shift; X ray photoelectron spectroscopy |
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55576358000 Talik N.A. Yap B.K. Tan C.Y. Whitcher T.J. |
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Talik N.A. Yap B.K. Tan C.Y. Whitcher T.J. |
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Talik N.A. Yap B.K. Tan C.Y. Whitcher T.J. In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS |
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Talik N.A. |
| title |
In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS |
| title_short |
In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS |
| title_full |
In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS |
| title_fullStr |
In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS |
| title_full_unstemmed |
In-situ analysis energy level alignment at solution processed HAT(CN)6/PVK (PVK:TAPC) interface via XPS and UPS |
| title_sort |
in-situ analysis energy level alignment at solution processed hat(cn)6/pvk (pvk:tapc) interface via xps and ups |
| publisher |
Elsevier B.V. |
| publishDate |
2023 |
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1806427807117475840 |
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13.214268 |