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Evaluation of static performance of optoelectronic semiconductor devices under X-rays irradiation

International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.

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Bibliographic Details
Main Authors: Haider F., Abdul Amir, Fuei, Pien Chee
Format: Working Paper
Language:English
Published: Universiti Malaysia Perlis 2010
Subjects:
Optoelectronic
X-rays
Total Ionizing Dose (TID)
Commercial-off-the shelf (COTS)
devices under test (DUT)
current transfer ratio (CTR)
International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI)
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/9020
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Summary:International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.

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