Comments: The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect

Organized by Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), 18th - 19th May 2005 at Putra Palace Hotel, Kangar.

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Bibliographic Details
Main Author:	Nor Farahidah, Za’bah
Format:	Working Paper
Language:	English
Published:	Kolej Universiti Kejuruteraan Utara Malaysia 2009
Subjects:	Embedded computer systems Electrical Design Automation (EDA) Automatic test equipment Electronic apparatus and appliances > Testing Electronic apparatus and appliances > Design and construction
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/7106
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