The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect

Organized by Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), 18th - 19th May 2005 at Putra Palace Hotel, Kangar.

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Bibliographic Details
Main Author: Nor Farahidah, Za’bah
Format: Working Paper
Language:English
Published: Kolej Universiti Kejuruteraan Utara Malaysia 2009
Subjects:
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/7106
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