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The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect

Organized by Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), 18th - 19th May 2005 at Putra Palace Hotel, Kangar.

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Bibliographic Details
Main Author: Nor Farahidah, Za’bah
Format: Working Paper
Language:English
Published: Kolej Universiti Kejuruteraan Utara Malaysia 2009
Subjects:
Embedded computer systems
Electrical Design Automation (EDA)
Automatic test equipment
Electronic apparatus and appliances > Testing
Electronic apparatus and appliances > Design and construction
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/7106
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id my.unimap-7106
record_format dspace
spelling my.unimap-71062009-08-28T02:02:04Z The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect Nor Farahidah, Za’bah Embedded computer systems Electrical Design Automation (EDA) Automatic test equipment Electronic apparatus and appliances -- Testing Electronic apparatus and appliances -- Design and construction Organized by Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), 18th - 19th May 2005 at Putra Palace Hotel, Kangar. External testing of embedded memories by means of an Automated Test Equipment ( ATE ) based test methodology was popular in the early 1990s. However, as memory designs become more complex, the limitations of ATE had raised a need for high quality embedded memory-testing methods. One of these methods is known as Built-in Self Test ( BIST ). This paper provides a comprehensive study of this method using an Electrical Design Automation ( EDA ) tool known as MBISTArchitect. Using this tool, the testing time of using BIST for memories of different types and sizes, and the impact of its circuitry on the area overhead is examined. In addition, using some of its features, the impact on the area overhead by means of adding a diagnostic capability to the BIST circuitry and by using a shared BIST controller for multiple memories is also investigated. 2009-08-28T01:41:42Z 2009-08-28T01:41:42Z 2005-05-18 Working Paper p.117-121 http://hdl.handle.net/123456789/7106 en Proceedings of the 1st National Conference on Electronic Design Kolej Universiti Kejuruteraan Utara Malaysia
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Embedded computer systems
Electrical Design Automation (EDA)
Automatic test equipment
Electronic apparatus and appliances -- Testing
Electronic apparatus and appliances -- Design and construction
spellingShingle Embedded computer systems
Electrical Design Automation (EDA)
Automatic test equipment
Electronic apparatus and appliances -- Testing
Electronic apparatus and appliances -- Design and construction
Nor Farahidah, Za’bah
The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect
description Organized by Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), 18th - 19th May 2005 at Putra Palace Hotel, Kangar.
format Working Paper
author Nor Farahidah, Za’bah
author_facet Nor Farahidah, Za’bah
author_sort Nor Farahidah, Za’bah
title The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect
title_short The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect
title_full The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect
title_fullStr The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect
title_full_unstemmed The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect
title_sort application of built-in self test (bist) for embedded memory testing via mbistarchitect
publisher Kolej Universiti Kejuruteraan Utara Malaysia
publishDate 2009
url http://dspace.unimap.edu.my/xmlui/handle/123456789/7106
_version_ 1643788687017771008
score 13.214268

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