The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices
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my.unimap-685132020-10-26T06:20:30Z The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices C.M., Cheh Mohd Khairuddin, Md Arshad Ruslinda, Abdul Rahim C., Ibau Voon, Chun Hong Ramzan, Mat Ayub Uda, Hashim mohd.khairuddin@unimap.edu.my Platinum diffusion Diode Power rectifier diode Link to publisher's homepage at https://www.matec-conferences.org/ The reverse recovery lifetime of a diode is one the key parameter in power electronics market. To make a diode with fast switching speed, diodes are often doped with impurities such as gold and platinum to improve its lifetime. In this works, we present the reverse recovery lifetime improvement of a power rectifier diode through platinum diffusion in the intrinsic region in between P-N junction using Design of Experiment (DOE) approach. A commercial available power rectifier is used in this study. We factored in the temperature and thermal diffusion time during the platinum diffusion process in our DOE. From results, DOE 2 (with shorter thermal duration and high temperature for diffusion) is selected based on meeting requirement for forward voltage and reverse recovery specifications i.e. forward voltage at 1.8V and reverse recovery time at 27ns. 2020-10-26T06:20:30Z 2020-10-26T06:20:30Z 2016 Article MATEC Web of Conferences, vol.78, 2016, 7 pages 2261-236X (online) http://dspace.unimap.edu.my:80/xmlui/handle/123456789/68513 https://www.matec-conferences.org/ en EDP Sciences |
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Platinum diffusion Diode Power rectifier diode |
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Platinum diffusion Diode Power rectifier diode C.M., Cheh Mohd Khairuddin, Md Arshad Ruslinda, Abdul Rahim C., Ibau Voon, Chun Hong Ramzan, Mat Ayub Uda, Hashim The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices |
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Link to publisher's homepage at https://www.matec-conferences.org/ |
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mohd.khairuddin@unimap.edu.my |
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mohd.khairuddin@unimap.edu.my C.M., Cheh Mohd Khairuddin, Md Arshad Ruslinda, Abdul Rahim C., Ibau Voon, Chun Hong Ramzan, Mat Ayub Uda, Hashim |
format |
Article |
author |
C.M., Cheh Mohd Khairuddin, Md Arshad Ruslinda, Abdul Rahim C., Ibau Voon, Chun Hong Ramzan, Mat Ayub Uda, Hashim |
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C.M., Cheh |
title |
The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices |
title_short |
The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices |
title_full |
The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices |
title_fullStr |
The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices |
title_full_unstemmed |
The Impacts of Platinum Diffusion to the Reverse Recovery Lifetime of a High Power Diode Devices |
title_sort |
impacts of platinum diffusion to the reverse recovery lifetime of a high power diode devices |
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EDP Sciences |
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2020 |
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http://dspace.unimap.edu.my:80/xmlui/handle/123456789/68513 |
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1698698471057391616 |
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13.214268 |