Comments: Two dimensional simulation and analysis of density-of-states (DOS) in top-gated nanocrystalline silicon thin film transistor (nc-Si TFT)

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Bibliographic Details
Main Authors:	Sharma, Prachi, Gupta, Navneet
Other Authors:	prachi.sharma@pilani.bits-pilani.ac.in
Format:	Article
Language:	English
Published:	Universiti Malaysia Perlis (UniMAP) 2017
Subjects:	Nanocrystalline silicon Thin film transistor TCAD ATLAS Channel length Density of states
Online Access:	http://dspace.unimap.edu.my:80/xmlui/handle/123456789/49933
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