Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging
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my.unimap-321242014-02-24T04:23:35Z Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging Noor Asikin, Ab Ghani Iziana, Yahya Mohd Arif Anuar, Mohd Salleh Saidatulakmar, Shamsuddin Zainal Arifin, Ahmad Ramani, Mayappan asikinabghani@gmail.com izianayahya@gmail.com arifanuar@unimap.edu.my saida@perlis.uitm.edu.my zainal@eng.usm.my ramani@perlis.uitm.edu.my Intermetallic Powder metallurgy Scanning electron microscope (SEM) Sn-Ag-Cu-Ni Thermal aging Link to publisher's homepage at http://www.scientific.net Due to environmental concerns, lead-free solders were introduced in replacing the lead-based solders in microelectronics devices technology. Although there are many lead-free solder available, the Sn-Ag-Cu solder was considered the best choice. But the solder has its draw backs in terms of melting temperature and intermetallic formations. In this study, the effect of 0.5wt% Ni addition on the microstructure of the Sn-3.5Ag-1.0Cu solder was investigated. The solder was synthesized via powder metallurgy route which includes blending, compacting and sintering. The solders were characterized for its densities and melting temperatures. SEM was used to observe the microstructure of intermetallic phases. The solders were melted on copper substrate at 250°C for one minute and aged at 150°C from 0 to 400 hours. The phases formed were studied under SEM. The SEM results showed the presence of Cu₆Sn₅, Cu₃Sn, Ag₃Sn and (Cu,Ni)₆Sn₅ intermetallics. 2014-02-24T04:19:11Z 2014-02-24T04:19:11Z 2012-12 Article Noor Asikin Ab Ghani et al., Advanced Materials Research, vol.620, 2012, pages 263-267 1022-6680 http://www.scientific.net/AMR.620.263 http://dspace.unimap.edu.my:80/dspace/handle/123456789/32124 en Scientific.Net |
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Intermetallic Powder metallurgy Scanning electron microscope (SEM) Sn-Ag-Cu-Ni Thermal aging |
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Intermetallic Powder metallurgy Scanning electron microscope (SEM) Sn-Ag-Cu-Ni Thermal aging Noor Asikin, Ab Ghani Iziana, Yahya Mohd Arif Anuar, Mohd Salleh Saidatulakmar, Shamsuddin Zainal Arifin, Ahmad Ramani, Mayappan Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging |
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Link to publisher's homepage at http://www.scientific.net |
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asikinabghani@gmail.com |
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asikinabghani@gmail.com Noor Asikin, Ab Ghani Iziana, Yahya Mohd Arif Anuar, Mohd Salleh Saidatulakmar, Shamsuddin Zainal Arifin, Ahmad Ramani, Mayappan |
| format |
Article |
| author |
Noor Asikin, Ab Ghani Iziana, Yahya Mohd Arif Anuar, Mohd Salleh Saidatulakmar, Shamsuddin Zainal Arifin, Ahmad Ramani, Mayappan |
| author_sort |
Noor Asikin, Ab Ghani |
| title |
Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging |
| title_short |
Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging |
| title_full |
Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging |
| title_fullStr |
Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging |
| title_full_unstemmed |
Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging |
| title_sort |
microstructure evolution of sn-3.5ag-1.0cu-0.5ni/cu system lead free solder under long term thermal aging |
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Scientific.Net |
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2014 |
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http://dspace.unimap.edu.my:80/dspace/handle/123456789/32124 |
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13.222552 |