A study for optimum productivity yield in 0.16μm mixed of wafer fabrication facility

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Bibliographic Details
Main Authors: Mohd Azizi, Chik, Ve, Chun Yung, Balakrishna, Puvaneswaran, Uda, Hashim, Prof. Dr., Ibrahim, Ahmad, Bashir, Mohamad
Format: Working Paper
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE) 2010
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Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/10347
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