New possibilities of using DEMATEL and ERPN in the new PFMEA hybrid model

• Main Authors: Bujna, Marián, Lee, Chia Kuang, Kadnár, Milan, Korenko, Maroš, Baláži, Juraj
• Format: Article
• Language: English
• Published: MDPI 2023
• Subjects: HD28 Management. Industrial Management; T Technology (General); TP Chemical technology
• Online Access: http://umpir.ump.edu.my/id/eprint/37611/1/New%20possibilities%20of%20using%20DEMATEL%20and%20ERPN%20in%20the%20New%20PFMEA%20hybrid%20model.pdf; http://umpir.ump.edu.my/id/eprint/37611/; https://doi.org/10.3390/app13063627; https://doi.org/10.3390/app13063627

The aim of the paper is to examine the requirements of producers in post-communist countries with lower economic level. The first requirement was how to overcome the limitations of conventional PFMEA to propose measures effectively. The second requirement solved the economic effect of failure modes. The aim of the paper was to create a new hybrid PFMEA–DEMATEL–ERPN model to manage failure modes to resolve the requirements. The DEMATEL model overcame the limitations of PFMEA. DEMATEL data were used to estimate the functionality of the proposed models. Criteria such as the occurrence of defective products and the probability of their occurrence (O and RPN) were monitored. ERPN also overcame the limitations of PFMEA. Internal and external costs arise as effects of failure modes. The costs were included in the economic evaluation of the models. We validated the models in a transfer pressing process. The estimation of models’ functionality proved to be correct. The economic evaluation refined the research results and resolved the second requirement of the manufacturers. The DEMATEL and ERPN models (compared to PFMEA) proved their validity when the use of PFMEA was limited. By using DEMATEL, we registered the lowest number of defective products and the lowest costs.