Characterization of sub-millimeter backside-slit defects on galvanized steel plates using a phase-sensitive AMR gradiometer and low excitation frequency

• Main Authors: Mohd Mawardi, Saari, Mohd Aufa Hadi Putera, Zaini, Nurul Ain, Nadzri, Mohd Herwan, Sulaiman, Aiman, Mohd Halil, Kenji, Sakai, Toshihiko, Kiwa, Keiji, Tsukada
• Format: Conference or Workshop Item
• Language: English; English
• Published: Universiti Malaysia Pahang 2020
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://umpir.ump.edu.my/id/eprint/28846/1/31.%20Characterization%20of%20sub-millimeter%20backside-slit%20defects.pdf; http://umpir.ump.edu.my/id/eprint/28846/2/31.1%20Characterization%20of%20sub-millimeter%20backside-slit%20defects.pdf; http://umpir.ump.edu.my/id/eprint/28846/

Backside inspection of metallic materials such as the widely used galvanized steels, is a challenging inspection in Non-Destructive Tests (NDTs) using eddy current (EC) and magnetic flux leakage (MFL) techniques. This is due to the propagation characteristic of electromagnetic waves is governed by t...