Enhancement of electrical performance of Ge-based metal-oxide-semiconductor capacitor via formation of trigonal-Sm2O3
In this study, Sm2O3/Ge stack based capacitor prepared from thermally oxidized/nitrided sputtered metallic Sm on Ge semiconductor in N2O ambient for several oxidation/nitridation durations, i.e., 5 - 20 min have been comprehensively investigated. The film crystallinity, chemical composition and inte...
Saved in:
Main Authors: | , , , |
---|---|
Format: | Article |
Published: |
2021
|
Subjects: | |
Online Access: | http://eprints.um.edu.my/26290/ https://doi.org/10.1016/j.surfin.2021.101289 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|