Enhancement of electrical performance of Ge-based metal-oxide-semiconductor capacitor via formation of trigonal-Sm2O3

In this study, Sm2O3/Ge stack based capacitor prepared from thermally oxidized/nitrided sputtered metallic Sm on Ge semiconductor in N2O ambient for several oxidation/nitridation durations, i.e., 5 - 20 min have been comprehensively investigated. The film crystallinity, chemical composition and inte...

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Bibliographic Details
Main Authors: Onik, Tahsin Ahmed Mozaffor, Hawari, Huzein Fahmi, Mohd Faizul, Mohd Sabri, Wong, Yew Hoong
Format: Article
Published: 2021
Subjects:
Online Access:http://eprints.um.edu.my/26290/
https://doi.org/10.1016/j.surfin.2021.101289
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