High level synthesis for parallel scan / Rihana Yusuf, Norsabrina Sihab and Zurita Zulkifli
As digital systems become more complex, they become much harder and expensive to test. One solution to this problem is to add logic to the Integrated Circuit (IC) so that it can be testable. This concept is an important aspect to be considered in early stage of IC design process. This is different f...
Saved in:
Main Authors: | , , |
---|---|
Format: | Research Reports |
Language: | English |
Published: |
2009
|
Subjects: | |
Online Access: | http://ir.uitm.edu.my/id/eprint/39980/1/39980.PDF http://ir.uitm.edu.my/id/eprint/39980/ |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|