High level synthesis for parallel scan / Rihana Yusuf, Norsabrina Sihab and Zurita Zulkifli

As digital systems become more complex, they become much harder and expensive to test. One solution to this problem is to add logic to the Integrated Circuit (IC) so that it can be testable. This concept is an important aspect to be considered in early stage of IC design process. This is different f...

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Bibliographic Details
Main Authors: Yusuf, Rihana, Sihab, Norsabrina, Zulkifli, Zurita
Format: Research Reports
Language:English
Published: 2009
Subjects:
Online Access:http://ir.uitm.edu.my/id/eprint/39980/1/39980.PDF
http://ir.uitm.edu.my/id/eprint/39980/
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