Signal integrity analysis and noise source extraction of integrated circuits using IBIS models

• Main Authors: Baba, Tamana, Che Mustapha, Nurul Arfah, Hasbullah, Nurul Fadzlin
• Format: Conference or Workshop Item
• Language: English; English
• Published: IEEE 2021
• Subjects: TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices; TK7885 Computer engineering
• Online Access: http://irep.iium.edu.my/95131/1/95131_Signal%20integrity%20analysis%20and%20noise%20source%20extraction.pdf; http://irep.iium.edu.my/95131/2/95131_Signal%20integrity%20analysis%20and%20noise%20source%20extraction_SCOPUS.pdf; http://irep.iium.edu.my/95131/; https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9511571&tag=1

Integrated Circuits (ICs) play a critical role in an electronic system's Electromagnetic Compatibility (EMC). Generally, ICs are the ultimate source of interference-causing signals and noise. Signal Integrity in ICs also poses increasing challenges to PCB designers. Analyzing the Signal Int...