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About the silicon sensitivity of the deep level with alternating pressure

This paper discusses the strain sensitivity of silicon with deep levels under variable pressure. It is shown that in the pressure swing in silicon with deep levels, there is a redistribution of the primary spatial inhomogeneities in the distribution of impurities so that the electron-hole relaxation...

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Main Authors: Tursunov, Ikromjon Gulamovich, Okhunov, Abdurahim, Mamatkarimov, Odiljon Oxundadaevich
Format: Article
Language:English
English
English
Published: IIUM Press, International Islamic University Malaysia 2018
Subjects:
QC Physics
Online Access:http://irep.iium.edu.my/67747/1/67747_About%20the%20Silicon%20Sensitivity%20of%20the%20Deep.pdf
http://irep.iium.edu.my/67747/7/67747_About%20the%20silicon%20sensitivity_scopus.pdf
http://irep.iium.edu.my/67747/12/67747%20ABOUT%20THE%20SILICON%20SENSITIVITY%20%20WOS.pdf
http://irep.iium.edu.my/67747/
http://journals.iium.edu.my/ejournal/index.php/iiumej/article/view/794/663
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spelling my.iium.irep.677472019-01-27T07:40:31Z http://irep.iium.edu.my/67747/ About the silicon sensitivity of the deep level with alternating pressure Tursunov, Ikromjon Gulamovich Okhunov, Abdurahim Mamatkarimov, Odiljon Oxundadaevich QC Physics This paper discusses the strain sensitivity of silicon with deep levels under variable pressure. It is shown that in the pressure swing in silicon with deep levels, there is a redistribution of the primary spatial inhomogeneities in the distribution of impurities so that the electron-hole relaxation after stress relief will occur in the new potential relief. IIUM Press, International Islamic University Malaysia 2018-12 Article PeerReviewed application/pdf en http://irep.iium.edu.my/67747/1/67747_About%20the%20Silicon%20Sensitivity%20of%20the%20Deep.pdf application/pdf en http://irep.iium.edu.my/67747/7/67747_About%20the%20silicon%20sensitivity_scopus.pdf application/pdf en http://irep.iium.edu.my/67747/12/67747%20ABOUT%20THE%20SILICON%20SENSITIVITY%20%20WOS.pdf Tursunov, Ikromjon Gulamovich and Okhunov, Abdurahim and Mamatkarimov, Odiljon Oxundadaevich (2018) About the silicon sensitivity of the deep level with alternating pressure. IIUM Engineering Journal, 19 (2). pp. 164-171. ISSN 1511-788X http://journals.iium.edu.my/ejournal/index.php/iiumej/article/view/794/663 10.31436/iiumej.v19i2.794
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
English
English
topic QC Physics
spellingShingle QC Physics
Tursunov, Ikromjon Gulamovich
Okhunov, Abdurahim
Mamatkarimov, Odiljon Oxundadaevich
About the silicon sensitivity of the deep level with alternating pressure
description This paper discusses the strain sensitivity of silicon with deep levels under variable pressure. It is shown that in the pressure swing in silicon with deep levels, there is a redistribution of the primary spatial inhomogeneities in the distribution of impurities so that the electron-hole relaxation after stress relief will occur in the new potential relief.
format Article
author Tursunov, Ikromjon Gulamovich
Okhunov, Abdurahim
Mamatkarimov, Odiljon Oxundadaevich
author_facet Tursunov, Ikromjon Gulamovich
Okhunov, Abdurahim
Mamatkarimov, Odiljon Oxundadaevich
author_sort Tursunov, Ikromjon Gulamovich
title About the silicon sensitivity of the deep level with alternating pressure
title_short About the silicon sensitivity of the deep level with alternating pressure
title_full About the silicon sensitivity of the deep level with alternating pressure
title_fullStr About the silicon sensitivity of the deep level with alternating pressure
title_full_unstemmed About the silicon sensitivity of the deep level with alternating pressure
title_sort about the silicon sensitivity of the deep level with alternating pressure
publisher IIUM Press, International Islamic University Malaysia
publishDate 2018
url http://irep.iium.edu.my/67747/1/67747_About%20the%20Silicon%20Sensitivity%20of%20the%20Deep.pdf
http://irep.iium.edu.my/67747/7/67747_About%20the%20silicon%20sensitivity_scopus.pdf
http://irep.iium.edu.my/67747/12/67747%20ABOUT%20THE%20SILICON%20SENSITIVITY%20%20WOS.pdf
http://irep.iium.edu.my/67747/
http://journals.iium.edu.my/ejournal/index.php/iiumej/article/view/794/663
_version_ 1643619029761392640
score 13.211869

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