Single-event Transient (SET) effects on 60nm and 32nm 3T CMOS active pixel sensor

• Main Authors: Ahamad Sukor, Masturah, Hasbullah, Nurul Fadzlin, Ibrahim, Siti Noorjannah
• Format: Conference or Workshop Item
• Language: English
• Published: Penerbit UMT, Universiti Malaysia Terengganu (UMT) 2016
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://irep.iium.edu.my/53222/1/53222_Single-event%20transient%20%28SET%29.pdf; http://irep.iium.edu.my/53222/; http://umtas2016.umt.edu.my/?page_id=210

Nowadays, CMOS Active Pixel Sensors (APS) are widely used especially in space mission. However, the space consists of various kind of radiation. Single-Event Transient (SET) is one of the concern for the circuits in the radiation environment. SETs are becoming a common phenomenon with technology...