High Temperature Testingand Noise Integration of a Buck Converter usingSilicon and Silicon Carbide Diodes.

• Main Author: RAHMANOV, Murat
• Format: Final Year Project
• Language: English
• Published: Universiti Teknologi Petronas 2004
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://utpedia.utp.edu.my/8532/1/2004%20-%20High%20Temperature%20Testing%20and%20Noise%20Integration%20of%20a%20Buck%20Converter%20Using%20Silicon%20and%20Silic.pdf; http://utpedia.utp.edu.my/8532/

This project includes comparison of the advantages of enhanced SiC device performance at elevated temperatures over Si devices in a buck type DC/DC converter circuit. Being that elevated temperatures in a circuit have always caused energy losses and deviation in results, the manufacturers of sili...