Comparative Study of Constant Height Mode and Constant Detection Mode in Atomic Force Microscopy (AFM) Imaging.
Atomic Force Microscopy (AFM) is a kind of Scanning Probe Microscopes (SPM) which is designed to measure local properties of materials, such as height, area, friction and magnetism, using a probe that operates at high resolution. AFM demonstrates scanning resolution on the order of fractions of a na...
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| Format: | Final Year Project / Dissertation / Thesis |
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2016
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| Online Access: | http://eprints.utar.edu.my/2058/1/BEE%2D2016%2D1102029.pdf http://eprints.utar.edu.my/2058/ |
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