Physical properties of cuprous oxide thin films grown on n-Si substrate by Sol-Gel spin coating

Cu2O films were grown on n-Si substrates via the sol-gel spin-coating method. The films were annealed under 5% H2 + 95% N2 atmosphere at 350°C, 450°C and 550°C. Diffractogram obtained by the grazing angle x-ray diffractometry showed that the crystallinity of the films increased with increasing anne...

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Bibliographic Details
Main Authors: D.S. Che Halin,, I.A. Talib,, A.R. Daud,, M.A.A. Hamid,
Format: Article
Language:English
Published: Universiti Kebangsaan Malaysia 2009
Online Access:http://journalarticle.ukm.my/67/1/
http://journalarticle.ukm.my/67/
http://www.ukm.my/~jsm/contents.html
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