FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES
Nowadays, circuit design technologies have progressively advanced to cope with the high performance of the electronic components. With the circuit design advancement,the technology for IC fabrication has moved to deep submicron era. As the circuit sizes continue to scale down to nanoscale, the nu...
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2014
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oai:utpedia.utp.edu.my:226982024-07-24T02:49:06Z http://utpedia.utp.edu.my/id/eprint/22698/ FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES SOCHEATRA, SOEUNG TK Electrical engineering. Electronics Nuclear engineering Nowadays, circuit design technologies have progressively advanced to cope with the high performance of the electronic components. With the circuit design advancement,the technology for IC fabrication has moved to deep submicron era. As the circuit sizes continue to scale down to nanoscale, the number of transistors and interconnects on the circuits tends to grow as well. This challengesthe circuit testing by introducing high number of possible faults on the circuit. Consequently, the product qualitycontrol has become more challenging. The product quality could drop significantly ifthe circuits are not designed to be testable. 2014 Thesis NonPeerReviewed application/pdf en http://utpedia.utp.edu.my/id/eprint/22698/1/20A662~1.PDF SOCHEATRA, SOEUNG (2014) FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES. Masters thesis, UTP. |
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TK Electrical engineering. Electronics Nuclear engineering SOCHEATRA, SOEUNG FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES |
description |
Nowadays, circuit design technologies have progressively advanced to cope
with the high performance of the electronic components. With the circuit design
advancement,the technology for IC fabrication has moved to deep submicron era. As
the circuit sizes continue to scale down to nanoscale, the number of transistors and
interconnects on the circuits tends to grow as well. This challengesthe circuit testing
by introducing high number of possible faults on the circuit. Consequently, the
product qualitycontrol has become more challenging. The product quality could drop
significantly ifthe circuits are not designed to be testable. |
format |
Thesis |
author |
SOCHEATRA, SOEUNG |
author_facet |
SOCHEATRA, SOEUNG |
author_sort |
SOCHEATRA, SOEUNG |
title |
FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING
ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES |
title_short |
FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING
ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES |
title_full |
FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING
ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES |
title_fullStr |
FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING
ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES |
title_full_unstemmed |
FEASIBILITY INVESTIGATION OF FAULT DIAGNOSIS USING
ELECTROMAGNETIC ANALYSIS OF PLANAR STRUCTURES |
title_sort |
feasibility investigation of fault diagnosis using
electromagnetic analysis of planar structures |
publishDate |
2014 |
url |
http://utpedia.utp.edu.my/id/eprint/22698/1/20A662~1.PDF http://utpedia.utp.edu.my/id/eprint/22698/ |
_version_ |
1805891071856607232 |
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13.214268 |