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Methodology of statistical RTS noise analysis with charge-carrier trapping models

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Main Authors: Tang, Tong Boon, Murray, Alan F, Roy, Scott
Format: Article
Published: IEEE 2010
Online Access:http://scholars.utp.edu.my/id/eprint/36597/
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spelling oai:scholars.utp.edu.my:365972023-06-19T04:19:08Z http://scholars.utp.edu.my/id/eprint/36597/ Methodology of statistical RTS noise analysis with charge-carrier trapping models Tang, Tong Boon Murray, Alan F Roy, Scott IEEE 2010 Article NonPeerReviewed Tang, Tong Boon and Murray, Alan F and Roy, Scott (2010) Methodology of statistical RTS noise analysis with charge-carrier trapping models. IEEE Transactions on Circuits and Systems I: Regular Papers, 57 (5). pp. 1062-1070.
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
format Article
author Tang, Tong Boon
Murray, Alan F
Roy, Scott
spellingShingle Tang, Tong Boon
Murray, Alan F
Roy, Scott
Methodology of statistical RTS noise analysis with charge-carrier trapping models
author_facet Tang, Tong Boon
Murray, Alan F
Roy, Scott
author_sort Tang, Tong Boon
title Methodology of statistical RTS noise analysis with charge-carrier trapping models
title_short Methodology of statistical RTS noise analysis with charge-carrier trapping models
title_full Methodology of statistical RTS noise analysis with charge-carrier trapping models
title_fullStr Methodology of statistical RTS noise analysis with charge-carrier trapping models
title_full_unstemmed Methodology of statistical RTS noise analysis with charge-carrier trapping models
title_sort methodology of statistical rts noise analysis with charge-carrier trapping models
publisher IEEE
publishDate 2010
url http://scholars.utp.edu.my/id/eprint/36597/
_version_ 1769845529033834496
score 13.214268

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