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Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images

Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic ob...

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Main Authors: Malik , Aamir Saeed, Tae, Sun Choi
Format: Conference or Workshop Item
Published: 2009
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utp.edu.my/4519/1/2009_ICCEE.pdf
http://eprints.utp.edu.my/4519/
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spelling my.utp.eprints.45192017-01-19T08:25:07Z Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images Malik , Aamir Saeed Tae, Sun Choi TK Electrical engineering. Electronics Nuclear engineering Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, Shape From Focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation. 2009-12 Conference or Workshop Item PeerReviewed application/pdf http://eprints.utp.edu.my/4519/1/2009_ICCEE.pdf Malik , Aamir Saeed and Tae, Sun Choi (2009) Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images. In: 2009 International Conference on Computer and Electrical Engineering, 28-30 December, 2009, Dubai, UAE. http://eprints.utp.edu.my/4519/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Malik , Aamir Saeed
Tae, Sun Choi
Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images
description Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, Shape From Focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation.
format Conference or Workshop Item
author Malik , Aamir Saeed
Tae, Sun Choi
author_facet Malik , Aamir Saeed
Tae, Sun Choi
author_sort Malik , Aamir Saeed
title Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images
title_short Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images
title_full Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images
title_fullStr Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images
title_full_unstemmed Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images
title_sort analysis of effects of texture reflectance and source illumination on focus measures for microscopic images
publishDate 2009
url http://eprints.utp.edu.my/4519/1/2009_ICCEE.pdf
http://eprints.utp.edu.my/4519/
_version_ 1738655347679166464
score 13.188404

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