Abnormality Detection and Failure Prediction Using Explainable Bayesian Deep Learning: Methodology and Case Study with Industrial Data

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Bibliographic Details
Main Authors: Nor, A.K.M., Pedapati, S.R., Muhammad, M., Leiva, V.
Format: Article
Published: MDPI 2022
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85124729775&doi=10.3390%2fmath10040554&partnerID=40&md5=a1656ffe9430765b994ee7e07163c7ff
http://eprints.utp.edu.my/28669/
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