Using A Cropping Technique or Not: Impacts on SVM-based AMD Detection on OCT Images

• Main Authors: Ko, C.-E., Chen, P.-H., Liao, W.-M., Lu, C.-K., Lin, C.-H., Liang, J.-W.
• Format: Conference or Workshop Item
• Published: Institute of Electrical and Electronics Engineers Inc. 2019
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85070449570&doi=10.1109%2fAICAS.2019.8771609&partnerID=40&md5=9fa13736e8774bf6e23cb3b527d65084; http://eprints.utp.edu.my/25096/