A study on fNIRS-based working memory load assessment and potential issues with extracerebral artifacts
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| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Published: |
Institute of Electrical and Electronics Engineers Inc.
2020
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85098963770&doi=10.1109%2fTENCON50793.2020.9293706&partnerID=40&md5=bca7ba5a375d3682952288b2925d9026 http://eprints.utp.edu.my/24491/ |
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