Modified short-run statistical process control for test and measurement process

• Main Authors: Koh, C.K., Chin, J.F., Kamaruddin, S.
• Format: Article
• Published: 2019
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85054607120&doi=10.1007%2fs00170-018-2776-1&partnerID=40&md5=295bffc954d2e830a677f795d757f7d5; http://eprints.utp.edu.my/22139/

The key characteristics of test and measurement (T&M) manufacturing are short-run, multi-product families and testing at multi-stations. These characteristics render statistical process control (SPC) inefficacious because inherently meagre data do not warrant meaningful control limits. Measureme...