Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems

• Main Authors: Ridwan, Intisar Ibrahim, Ali, Rosmah, Mohamed, Izzeldin Ibrahim, Adam, Mohamad Zulkefli, ElFadil, Nazar
• Format: Conference or Workshop Item
• Published: 2017
• Subjects: T Technology (General)
• Online Access: http://eprints.utm.my/id/eprint/97014/; http://dx.doi.org/10.1109/TENCON.2016.7848399

Embedded systems have become a significant manufacturing sector and essential in our life due to their large applications. As a result, higher education institutions acknowledge the significance for offering embedded system design course to electrical, electronics, and computer engineering students. Unfortunately, embedded systems design course continues to be challenging and complex despite current attempts in introducing new embedded system teaching methods. This paper deals with this issue by developing and validating an instrument to measure students' readiness to learn embedded systems using Rasch model. An expert panel was used to verify the content validity and a pilot study (N = 40 respondents) was performed to measure the instrument reliability. A total of 365 respondents from different universities completed the 10-item scale and provided demographic data. The scale dimensionality was evaluated using WINSTEPS 3.92.1, with results showed that all the items fit the Rasch measurement model with acceptable fit index (0.6-1.4) and expressed revealed good consistency, with reliability alpha of 1.00 and 0.72 for items and persons respectively. The instrument was found to have appropriate psychometric properties, and the overall results are well aligned with theoretical expectations. This work has shown that the students were not technically ready for embedded system study.