Electronic properties of zigzag silicene nanoribbons with single vacancy defect

Silicene is envisaged as one of the two-dimensional (2D) materials for future nanoelectronic applications. In addition to its extraordinary electronic properties, it is predicted to be compatible with the silicon (Si) fabrication technology. By using nearest neighbour tight-binding (NNTB) approach,...

Full description

Saved in:
Bibliographic Details
Main Authors: Chuan, M. W., Wong, K. L., Hamzah, A., Alias, N. E., Lim, C. S., Tan, M. L. P.
Format: Article
Language:English
Published: Institute of Advanced Engineering and Science 2020
Subjects:
Online Access:http://eprints.utm.my/id/eprint/87887/1/LoongPengTan2020ElectronicPropertiesofZigzagSilicene.pdf
http://eprints.utm.my/id/eprint/87887/
http://www.dx.doi.org/10.11591/ijeecs.v19.i1.pp76-84
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.utm.87887
record_format eprints
spelling my.utm.878872020-11-30T13:29:20Z http://eprints.utm.my/id/eprint/87887/ Electronic properties of zigzag silicene nanoribbons with single vacancy defect Chuan, M. W. Wong, K. L. Hamzah, A. Alias, N. E. Lim, C. S. Tan, M. L. P. TK Electrical engineering. Electronics Nuclear engineering Silicene is envisaged as one of the two-dimensional (2D) materials for future nanoelectronic applications. In addition to its extraordinary electronic properties, it is predicted to be compatible with the silicon (Si) fabrication technology. By using nearest neighbour tight-binding (NNTB) approach, the electronic properties of zigzag silicene nanoribbons (ZSiNRs) with single vacancy (SV) defects are modelled and simulated. For 4-ZSiNR with L=2, the band structures and density of states (DOS) are computed based on SV incorporated ZSiNRs at varying defect locations. The results show that the SV defect will shift the band structure and increase the peak of DOS while the bandgap remain zero. This work provides a theoretical framework to understand the impact of SV defect which is an inevitable non-ideal effect during the fabrication of silicene nanoribbons (SiNRs). Institute of Advanced Engineering and Science 2020 Article PeerReviewed application/pdf en http://eprints.utm.my/id/eprint/87887/1/LoongPengTan2020ElectronicPropertiesofZigzagSilicene.pdf Chuan, M. W. and Wong, K. L. and Hamzah, A. and Alias, N. E. and Lim, C. S. and Tan, M. L. P. (2020) Electronic properties of zigzag silicene nanoribbons with single vacancy defect. Indonesian Journal of Electrical Engineering and Computer Science, 19 (1). pp. 77-84. ISSN 2502-4752 http://www.dx.doi.org/10.11591/ijeecs.v19.i1.pp76-84 DOI: 10.11591/ijeecs.v19.i1.pp76-84
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
language English
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Chuan, M. W.
Wong, K. L.
Hamzah, A.
Alias, N. E.
Lim, C. S.
Tan, M. L. P.
Electronic properties of zigzag silicene nanoribbons with single vacancy defect
description Silicene is envisaged as one of the two-dimensional (2D) materials for future nanoelectronic applications. In addition to its extraordinary electronic properties, it is predicted to be compatible with the silicon (Si) fabrication technology. By using nearest neighbour tight-binding (NNTB) approach, the electronic properties of zigzag silicene nanoribbons (ZSiNRs) with single vacancy (SV) defects are modelled and simulated. For 4-ZSiNR with L=2, the band structures and density of states (DOS) are computed based on SV incorporated ZSiNRs at varying defect locations. The results show that the SV defect will shift the band structure and increase the peak of DOS while the bandgap remain zero. This work provides a theoretical framework to understand the impact of SV defect which is an inevitable non-ideal effect during the fabrication of silicene nanoribbons (SiNRs).
format Article
author Chuan, M. W.
Wong, K. L.
Hamzah, A.
Alias, N. E.
Lim, C. S.
Tan, M. L. P.
author_facet Chuan, M. W.
Wong, K. L.
Hamzah, A.
Alias, N. E.
Lim, C. S.
Tan, M. L. P.
author_sort Chuan, M. W.
title Electronic properties of zigzag silicene nanoribbons with single vacancy defect
title_short Electronic properties of zigzag silicene nanoribbons with single vacancy defect
title_full Electronic properties of zigzag silicene nanoribbons with single vacancy defect
title_fullStr Electronic properties of zigzag silicene nanoribbons with single vacancy defect
title_full_unstemmed Electronic properties of zigzag silicene nanoribbons with single vacancy defect
title_sort electronic properties of zigzag silicene nanoribbons with single vacancy defect
publisher Institute of Advanced Engineering and Science
publishDate 2020
url http://eprints.utm.my/id/eprint/87887/1/LoongPengTan2020ElectronicPropertiesofZigzagSilicene.pdf
http://eprints.utm.my/id/eprint/87887/
http://www.dx.doi.org/10.11591/ijeecs.v19.i1.pp76-84
_version_ 1685579004455682048
score 13.222552