Defect detection in thermal image using thresholding technique

• Main Authors: Heriansyah, Rudi, Syed Abu Bakar, Syed Abdul Rahman
• Format: Conference or Workshop Item
• Published: 2007
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/8630/

This paper proposes a technique to detect defects as depicted in a thermal image. The technique is based on a local neighborhood pixel operation using kernel window 3x3. All pixels within this window will be mapped to only a single pixel value. Next, the thresholding technique is used. The main focu...