Graphene as charge storage layer in floating gate flash memory with high-k tunnel barrier engineering
This study aims to investigate the memory performances of graphene as a charge storage layer in the floating gate with the different type of high-k materials such as silicon nitride (Si3N4), aluminium oxide (Al2O3), hafnium dioxide (HfO2) and zirconium oxide (ZrO2) using Silvaco ATLAS TCAD Tools. Th...
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Main Authors: | , , , , , |
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Format: | Conference or Workshop Item |
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2018
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Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/83528/ http://dx.doi.org/10.1109/SCORED.2018.8710905 |
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