A knowledge diagnostic system for product defects

• Main Authors: Wong, Kuan Yew, Okfalisa, Okfalisa, Salim, Naomie
• Format: Article
• Language: English
• Published: CRC Press and Taylor & Francis 2008
• Subjects: T Technology (General)
• Online Access: http://eprints.utm.my/id/eprint/5711/1/A_knowledge_diagnostic_system_for_product_defects.pdf; http://eprints.utm.my/id/eprint/5711/; http://conference.iproms.org/a_knowledge_diagnostic_system_for_product_defects_1

The need to fulfill customer satisfaction and increase product quality has motivated many manufacturing firms to investigate and diagnose their product failure. To gain a correct and accurate diagnostic, the entire processing root must be recorded and controlled in every step of the manufacturing pr...