Fundamental sensor development in electrical resistance tomography

• Main Authors: Ling, En Hong, Abdul Rahim, Ruzairi, Ahmad, Anita, Md. Yunus, Mohd. Amri, Aba, Khairul Hamimah, Leow, Leow Pei, Wahid, Herman, Ahmad, Nasarudin, Abd. Shaib, Mohd. Fadzli, Abdul Wahab, Yasmin, Aw, Suzanna Ridzuan, Rahiman, Hafiz Fazalul, Zakaria, Zulkarnay
• Format: Article
• Language: English
• Published: Penerbit UTM Press 2015
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/55417/1/RuzairiAbdulRahim2015_FundamentalSensorDevelopmentinElectricalResistance.pdf; http://eprints.utm.my/id/eprint/55417/; http://dx.doi.org/10.11113/jt.v73.4431

This paper will provide a fundamental understanding of one of the most commonly used tomography, Electrical Resistance Tomography (ERT). Unlike the other tomography systems, ERT displayed conductivity distribution in the Region of Interest (ROI) and commonly associated to Sensitivity Theorem in thei...