Study on test compaction in high-level Automatic Test Pattern Generation (ATPG) platform

• Main Authors: Chin, Ayub Abdullah, Ooi, Chia Yee
• Format: Article
• Published: 2013
• Subjects: TJ Mechanical engineering and machinery
• Online Access: http://eprints.utm.my/id/eprint/40911/

Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects cau...