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Characterization of leakage current on high voltage glass insulators using wavelet transform technique

The measurement and analysis of leakage current (LC) for condition-based monitoring and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Leakage current plays an important role in the detection of insulator's condition. This paper propos...

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Main Authors: Algeelani, Nasir Ahmed, Mohamed Piah, Mohamed Afendi
Format: Book Section
Published: IEEE 2012
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utm.my/id/eprint/34559/
http://dx.doi.org/10.1109/ICIAS.2012.6306139
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spelling my.utm.345592017-02-02T04:59:14Z http://eprints.utm.my/id/eprint/34559/ Characterization of leakage current on high voltage glass insulators using wavelet transform technique Algeelani, Nasir Ahmed Mohamed Piah, Mohamed Afendi TK Electrical engineering. Electronics Nuclear engineering The measurement and analysis of leakage current (LC) for condition-based monitoring and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Leakage current plays an important role in the detection of insulator's condition. This paper proposes a method for reducing the noise included in the current signal. The tests were carried out on cleaned and polluted glass insulators by using surface tracking and erosion test procedure of IEC 60587. Wavelet analysis method is used to compress the leakage current data. Experimental results shows that the actual signals of leakage current are related to the levels of insulator contamination. IEEE 2012 Book Section PeerReviewed Algeelani, Nasir Ahmed and Mohamed Piah, Mohamed Afendi (2012) Characterization of leakage current on high voltage glass insulators using wavelet transform technique. In: ICIAS 2012 - 2012 4th International Conference on Intelligent and Advanced Systems: A Conference of World Engineering, Science and Technology Congress (ESTCON) - Conference Proceedings. IEEE, New York, USA, pp. 882-885. ISBN 978-145771967-7 http://dx.doi.org/10.1109/ICIAS.2012.6306139 DOI:10.1109/ICIAS.2012.6306139
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Algeelani, Nasir Ahmed
Mohamed Piah, Mohamed Afendi
Characterization of leakage current on high voltage glass insulators using wavelet transform technique
description The measurement and analysis of leakage current (LC) for condition-based monitoring and as a means of predicting flashover of polluted insulators has attracted a lot of research in recent years. Leakage current plays an important role in the detection of insulator's condition. This paper proposes a method for reducing the noise included in the current signal. The tests were carried out on cleaned and polluted glass insulators by using surface tracking and erosion test procedure of IEC 60587. Wavelet analysis method is used to compress the leakage current data. Experimental results shows that the actual signals of leakage current are related to the levels of insulator contamination.
format Book Section
author Algeelani, Nasir Ahmed
Mohamed Piah, Mohamed Afendi
author_facet Algeelani, Nasir Ahmed
Mohamed Piah, Mohamed Afendi
author_sort Algeelani, Nasir Ahmed
title Characterization of leakage current on high voltage glass insulators using wavelet transform technique
title_short Characterization of leakage current on high voltage glass insulators using wavelet transform technique
title_full Characterization of leakage current on high voltage glass insulators using wavelet transform technique
title_fullStr Characterization of leakage current on high voltage glass insulators using wavelet transform technique
title_full_unstemmed Characterization of leakage current on high voltage glass insulators using wavelet transform technique
title_sort characterization of leakage current on high voltage glass insulators using wavelet transform technique
publisher IEEE
publishDate 2012
url http://eprints.utm.my/id/eprint/34559/
http://dx.doi.org/10.1109/ICIAS.2012.6306139
_version_ 1643649608101920768
score 13.160551

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