Dielectric measurement using a planar rings sensor for low-loss powder form materials

This paper uses planar ring sensor for dielectric measurements of low-loss powder materials by applying conversion of measured reflection coefficient to relative dielectric constant via a lumped-element model. The ring sensor has been fabricated using 1.58 mm thickness of FR4 substrate and designed...

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書誌詳細
主要な著者: You, Kok Yeow, Hou, Kit Mun
フォーマット: Conference or Workshop Item
出版事項: 2012
オンライン・アクセス:http://eprints.utm.my/id/eprint/34056/
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